差分探头 *销售 TDP0500,P6251,P6250,TDP1000 差分探头的详细资料:
深圳市金博宇科技有限公司是专业从事测试仪器仪表设备的代理经销售后服务集成商,并与国内外仪表生产厂商有着广泛的技术与销售合作.作为美国菲利尔FLIR、美国FLUKE、美国泰克、美国Keithley 、美国安捷伦Agilent、中国台湾皇晶ACUTE、英国PEM、普源精电、青岛青智、费思泰克,华谊仪表,中国台湾固纬,德国惠美, 法国CA,中国台湾品致,长盛仪器,美尔诺,等诸多国内外代理与经销:主要销售的测试仪器仪表有: 示波器、信号源、万用表、热像仪、电流电压探头、电子负载、电源、频谱、等测试仪器。。
Outstanding Electrical Performance
- 1 GHz and 500 MHz Probe Bandwidth
- <1 pF Differential Input Capacitance
- 1 MΩ Differential Input Resistance
- ±42 V (DC + pk AC) Differential Input Voltage
- >18 dB CMRR (at 250 MHz 50x attenuation)
- Selectable Bandwidth-limiting Filters
- DC Reject
Versatile DUT Connectivity
- Small Compact Probe Head for Probing Small Geometry Circuit Elements
- Straight Pin, Square Pin, Solder Down, Variable Pitch Standard Accessories
- Robust Design for Reliability
Easy to Use
- Provides Automatic Units Scaling and Readout on the Oscilloscope Display
- TDP1000, TDP0500
- Connect Directly to the DPO7000, DPO4000, and MSO4000 Series Oscilloscopes Using TekVPI™ Probe Interface (No additional power adapters required)
- Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information
- AutoZero – Zeros Out Output Offset
- P6251, P6250
- Connect Directly to TDS5000 and other TekProbe™ Interface Oscilloscopes, or to TekConnect®Oscilloscopes Using TCA-BNC Adapter
Applications
- High-speed Switch Mode Power Supply Design
- CAN/LIN Bus Design
- High-speed Digital Design
- Digital Design and Characterization
- Manufacturing Engineering Test
- Research and Development
The TDP1000, TDP0500, P6251, and P6250 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today’s Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.
Specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. The TDP1000, TDP0500, P6251, and P6250 High-voltage Differential Probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:
- Outstanding Electrical Performance
- Versatile Device-Under-Test Connectivity
- Ease of Use