泰克差分探头

P6248 差分探头 P6247 泰克差分探头 P6246 高低压差分探头泰克差分探头

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深圳市金博宇科技有限公司

深圳市金博宇科技有限公司

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P6248 差分探头 P6247 泰克差分探头 P6246 高低压差分探头

详细介绍

 

P6248 差分探头 P6247 泰克差分探头 P6246 高低压差分探头的详细资料:

 

深圳市金博宇科技有限公司是专业从事测试仪器仪表设备的代理经销售后服务集成商,并与国内外仪表生产厂商有着广泛的技术与销售合作.作为美国菲利尔FLIR、美国FLUKE、美国泰克、美国Keithley 、美国安捷伦Agilent、中国台湾皇晶ACUTE、英国PEM、普源精电、青岛青智、费思泰克,华谊仪表,中国台湾固纬,德国惠美,法国CA,中国台湾品致,长盛仪器,美尔诺,等诸多国内外代理与经销:主要销售的测试仪器仪表有: 示波器、信号源、万用表、热像仪、电流电压探头、电子负载、电源、频谱、等测试仪器。

 

P6248
  • 1.7 GHz (Typical Probe Only ≤27 °C) 1X Mode
  • 1.5 GHz Bandwidth (Guaranteed)
  • 1.85 GHz (Typical Probe Only ≤27 °C) 10X Mode
P6247
  • >1.0 GHz Bandwidth (Guaranteed)
P6246
  • 400 MHz Bandwidth (Guaranteed)
General
  • Low Input Capacitance: <1 pF Differential
  • Probe Input Connector: Two Standard 0.025 in./0.63 mm (0.1 in. Center) Square Pin Receptacle (Female)
  • Electrostatic Discharge Tolerant (IEC 801-2)
  • Connects to TekProbe®BNC Interface on TDS Series Oscilloscopes or Other Instruments using 1103 TekProbe®Power Supply
  • For use with Oscilloscopes, Spectrum Analyzers, or Network Analyzers
  • >60 dB (1000:1) Common Mode Rejection Ratio (CMRR)
  • Small Probe Head Allows Easy Probing of SMDs
Applications
  • Communications (Gigabit Ethernet, IEEE-1394, Fibre Channel)
  • Semiconductor Characterization (RAMBUS)
  • Disk Drive Read Channel Design
  • Communication Pulse Shape Compliance
  • Jitter, Crosstalk, and BERT Measurements
  • Location of Ground Bounce
The P6246, P6247, and P6248 Differential Probes
The P6248, P6247, and P6246 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals commonly found in disk drive, digital IC design (RAMBUS), and communication applications (Gigabit Ethernet, IEEE-1394 Firewire, and Fibre Channel). The P6248 includes accessories that allow RAMBUS via probing and IEEE-1394 interconnect access. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface-mount devices while maintaining high CMRR.
The P6246, P6247, and P6248 are ideal for design verification of disk drive read, channel electronics, and timing analysis for troubleshooting ground-bounce problems associated with high-speed logic. They can also be used for pulse shape or crosstalk compliance testing of high-speed communication signals.
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