Rapid-Rate Thermal Cycle Chamber

ABOUT

Dedicated to a wide range of temperature testing
The Rapid-Rate Thermal Cycle Chamber is ideal for test requiring quick changes in specimen temperature, and covers various applications from JEDEC, IEC standards to screening.
It features new technologies, such as a specimen temperature control function maintaining linear specimen temperature change rates during rapid thermal cycling, and temperature ramp control.
 
 
Specifications Model Temperature range Inside / Outside dimensions （mm）
HTCC-150W -70 to +180C （-94 to +356F） W800xH500xD400 / W1000xH1808xD1915
 
 
 
Compatible Test standards
IEC-60749-25 : Semiconductor devices C Temperature cycling

IEC-60068-2-14 Nb : Environmental testing C Change of temperature

IEC-61147-5 : Liquid crystal and solid-state display devices C Environmental, endurance and mechanical test methods

JESD22-A105-B : Solid State Devices, testing quality and reliability C Power and temperature cycling

SAE-J1211 : Automotive components - Recommended environmental practices for electronic equipment design

IPC-9701 : Performance test methods and qualification requirements for surface mount solder attachments
 

FEATURES

Uniformity, reproducibility
Wind simulation allows achieving minimum temperature variations of the specimen, for accurate and quick temperature changes. Specimen temperature ramp rate is 15C/min, air temperature ramp rate is 23C/min.
Greater temperature ramp control
High precision of the specimen temperature control achieved thanks to a sensor for temperature specimen measurement, and the embedded high-speed controller.
In addition:
- refrigeration capacities increased at low temperatures,
- minimization of the difference between test area and specimen temperatures,
- airflow speed uniformity,
lead to excellent temperature ramp control.
Selection of the temperature control mode
Two temperature control modes are available:
- A specimen temperature control mode meeting ramp rate conditions of JEDEC standard （15C/min.）
- An air temperature control mode for temperature cycle tests.
Free access
Cable ports are equipped on both left and right side, to ease specimen access and wiring.
 Specimen temperature ramp control （Example）
 Test conditions
High temp. soak : +130C
Low temp. soak : -45C
Ramp rate : 15C/min.
Control point : Front center specimen on the lower level
Specimen : Printed Circuit Board, 145 130 mm, 90 pcs.
Measurement method
45 specimens placed in two rows on two levels in the specimen basket, with thermocouples attached to the surface of each specimen at the control point.
 

Temperature change （Example）
 Test conditions
High temp. soak : +125C 
Low temp. soak : -40C
Ramp rate : 15C/min.
Control point : Air outlet sensor
Specimen : Printed Circuit Board, 145 130 mm, 90 pcs.
Measurement method
As shown on the right, thermocouples are attached to the specimens at twelve measuring point.
 

OPTIONS

Paperless recorder
Temperature recorder for future installation
Specimen temperature measuring thermocouple
Integrating hour meter with reset
Overcool protector
Emergency stop switch
Cable port rubber plug
Fixture for securing body
Chamber dew tray
Communication cable
 Temperature recorder （digital）
Recorder terminal
Temperature attainment output
Additional overheat protector
External alarm terminal
Additional cable port
Specimen basket / shelf bracket
Casters
Communication functions
Power cord
 

 

info@hongzhan.com.hk