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E6607C EXT无线综合测试仪

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2022-08-13无锡市
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无锡诚成仪器仪表有限公司

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产品简介
E6607CEXT无线通信测试仪E6607CEXT无线通信测试仪E6607CEXTMultiportWirelessCommunicationsTestSet安捷伦科技公司日前宣布推出新型E6607CEXT无线通信测试仪
详细信息

E6607C EXT无线通信测试仪

E6607C
 

E6607C EXT无线通信测试仪
E6607C EXT Multiport Wireless Communications Test Set
安捷伦科技公司日前宣布推出新型 E6607C EXT 无线通信测试仪。该测试仪内置多端口适配器,可同时测试多个无线设备,以实现经济高效的大规模无线设备生产测试。与 EXT-B 相比,EXT-C的测试速度提升了3倍,但价格却降低了 1.3倍。
随着智能手机和平板电脑的产量越来越高,相应的测试方案也需要进行调整,以便适应当前包含多种功能无线装置、制式和频段的复杂无线设备。Agilent E6607C EXT-C 可提高测试速率,维持总体测试设备的成本效益,同时又能减少生产线的空间和电能需求,因而是应对上述测试挑战的理想选择。
Agilent E6607C EXT-C 是一款整合式单机综合测试仪,其配置包括矢量信号分析仪、矢量信号发生器、高速序列分析仪和 8个用于无线蜂窝制式的双向输入/输出端口以及4个用于GNSS测试的输出端口。
针对无线调制解调器芯片组中实施的快速序列非信令测试模式,*的 EXT-C 序列分析仪可以与调制解调器芯片组同步工作,消除信令开销,实现单次采集多次测量。EXT-C 可对经过*校准的多个被测器件执行测试,从而帮助制造商更快速地进行测试,并提高生产线的产量。
为了尽量减少测试流程的变化,并简化从研发到批量生产的过渡,EXT-C 利用安捷伦信号分析仪的各项丰富的 X 系列测量技术,为客户提供了专为快速生产制造测试而设计的测量应用软件。EXT-C 能够匹配多种 X 系列测量应用软件,用于蜂窝通信、无线连通性和数字音频/视频等应用。它支持 LTE FDD、LTE TDD、TD-SCDMA 和 2G/3G 等标准。单独 X 系列测量应用软件可在最初购买仪器时购买,也可在购买仪器后添加。
EXT-C 的全套软件工具功能互补,可以加快测试开发。例如,Agilent Signal Studio 可轻松创建非信令控制和测试信号,以便与 EXT 配合使用。在试生产阶段,Agilent Sequence Studio 支持工程师快速创建测试计划并进行故障诊断。为了地缩短生产代码测试开发的时间,安捷伦芯片组软件针对特定的无线芯片组调制解调器提供了自动化校准和验证功能。
E6607C 在功能方面*向后兼容上一代 E6607B EXT 和 E6617A MPA 组合。为了适应未来生产测试的需求,EXT-C 提供高达 3.8 GHz 的全蜂窝频段范围(包括 LTE TDD 43 频段),并支持芯片组要求的快速序列测试模式。
描述
Transforming manufacturing test
Improve your ROI while getting your next generation cellular devices to market faster

The Agilent Technologies E6607C (EXT-C) wireless communications test set has the capability you need to achieve high throughput test of your complex cellular devices with an effective investment of capital. In today’s competitive environment you cannot afford to pay for idle test equipment resources. With its integrated multiport capability the EXT-C makes optimum use of the integrated VSA/VSG with parallel receiver and fast switched transmitter testing.

The EXT-C is a one-box, non-signaling test set that integrates an innovative test sequencer, vector signal analyzer (VSA), vector signal generator (VSG) and a precision multiport adapter. The EXT-C includes eight bi-directional input/output ports for multi-format cellular testing, and four output ports for GNSS testing. Fast, standards-compliant measurements and modulation analysis capabilities are based on the proven measurement algorithms of the Agilent X-Series signal analyzers.

With the fast and accurate measurements, and flexible sequencer techniques of the E6607B (EXT-B), the EXT-C works to lower your cost of test with a lower cost integrated multi-port solution that provides additional benefits of reduced foot print and reduced power consumption.
主要特性与技术指标
Integrated Multiport Enables Efficient Multi-DUT Test
Integrated multiport provides for parallel receiver test / fast switched transmitter test making effective use of test equipment resources
Lower cost, smaller footprint, lower power consumption verses use of external multiport adapter
Fully compatible with software written for E6607A / E6607B for seamless integration in manufacturing
Add external display, mouse, and keyboard, for full manual control and functionality equivalent to E6607B & MPA
Anticipate your wireless device manufacturing test needs
Benefit from an architecture that is optimized for lower-cost next generation non-signaling test
Add multi-format standards-based calibration and verification test support as needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000®, GSM, EDGE-Evo, TD-SCDMA, WiMAXTM, Bluetooth®, GPS/GNSS, and more
Ensure your test system is future proof due to its modern, scalable architecture
Accelerate test development
Ensure seamless transition from NPI to production with proven X-Series analyzer measurements science
Simplify signal creation to synchronize, control, and test your wireless device with Signal Studio software
Streamline test plan creation and troubleshooting in a graphical interface with Sequence Studio software
Reduce time to volume manufacturing with Chipset Software to optimize device calibration and verification
Achieve fast and accurate measurements
Maximize throughput with fast-sequenced, non-signaling test modes for modern chipsets
Speed up your test plan in sequence analyzer mode with single acquisition, multiple measurements
Increase your production yield with superior measurement accuracy
Cost effective integrated Multiport Adapter with metrology grade precision and balancing


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