型号

盒(根)

产品描述

SSS-SEIH

10

Silicon cantilever for non-contact/tapping

-mode,special type A,

with SUPERSHARPSILICON tip

20

50

SSS-SEIHR

10

Silicon cantilever for non-contact/tapping

-mode,special type A,

with SUPERSHARPSILICON tip

detector side : Al-coating

20

50

qp-CONT

10

生物探针，悬臂梁: 共振频率11kHz 力常数 0.01 N/m; 应用范围：生物探针、液体探针；优势：力常数和共振频率波动范围小，特别适用于的定量纳米力学研究和生物测试

20

50

qp-SCONT

10

生物探针，悬臂梁: 共振频率11kHz 力常数 0.01 N/m; 应用范围：生物探针、液体探针；优势：力常数和共振频率波动范围小，特别适用于的定量纳米力学研究和生物测试

20

50

PtSi-CONT

10

导电探针，镀层: 铂硅； 比常规导电探针更耐磨，电学信号更长久，重复性好、分辨率高。应用范围：导电探针

20

50

ATEC-CONT

10

接触模式硅探针

20

50

ATEC-CONTPt

10

接触模式硅探针，镀层：Pt/Ir

20

50

ATEC-CONTAu

10

接触模式探针，臂梁及针尖镀层：镀金

ppp-CONT

10

接触模式探针，

20

50

PPP-CONT-W

380

PPP-CONTR

10

接触模式探针，镀层：Al

20

50

PPP-CONTR-W

380

PPP-XYCONTR

10

接触模式探针，镀层：Al ,XY-auto aligment

20

50

PPP-CONTPt

10

Silicon cantilever for contact mode,  detector side :Pt/Ir-coating ,tip side : Pt/Ir-coating

20

50

PPP-CONTPt-W

380

PPP-CONTAu

10

Silicon cantilever for contact mode,  detector and tip side : Au-coating

PPP-CONTAuD

10

Silicon cantilever for contact mode,  detector side : Au-coating

DT-CONTR

10

金刚石探针，接触模式，镀层：Al

20

50

CDT-CONTR

10

导电金刚石探针，接触模式，镀层：Al

20

50

PPP-ZEILR

10

silicon cantilever for contact mode, special type, detector side :Al-coating

20

50

PPP-ZEILR-W

380

PPP-RT-CONTR

10

silicon cantilever for contact mode, tip rotated by 180°,detector side :Al-coating

20

50

PL2-CONT

10

Silicon-SPM-Probe with plateau tip, silicon cantilever for contact mode,

PL2-CONTR

10

Silicon-SPM-Probe with plateau tip, silicon cantilever for contact mode, detector side: Al-coating

TL-CONT

10

Tipless silicon cantilever based on POINTPROBE technology

20

50

PPP-CONTSC

10

silicon cantilever for contact mode, short cantilever

20

50

PPP-CONTSCR

10

silicon cantilever for contact mode, short cantilever, detector side :Al-coating

20

50

PPP-CONTSCR-W

380

PPP-CONTSCPt

10

silicon cantilever for contact mode, short cantilever, detector side :Pt/Ir-coating

20

50

PPP-CONTSCAu

10

silicon cantilever for contact mode, short cantilever, detector and tip side :Au-coating

PPP-CONTSCAuD

10

silicon cantilever for contact mode, short cantilever, detector side :Au-coating

PtSi-FM

10

导电探针，镀层: 铂硅； 比常规导电探针更耐磨，电学信号更长久，重复性好、分辨率高。应用范围：导电探针

20

50

ATEC-FM

10

软轻敲探针，镀层: 无； 针尖可视的探针，可应用到对于那些针尖需要被精确定位或必须针尖可见的应用（例如，用于纳米操作）来说，ATEC是必然的。由于其超小的半锥角，ATEC系列产品在陡峭的小尺寸图案样品测量中表现出很好的性能. Silicon cantilever for force modulation mode,

20

50

ATEC-EFM

10

Silicon cantilever for force modulation mode, detector and tip side:Pt/Ir-coating

20

50

ATEC-FMAu

10

Silicon cantilever for force modulation mode, detector and tip side:Au-coating

PPP-LFMR

10

Silicon cantilever for lateral/friction force microscopy,detector side: Al-coating

20

50

PPP-LFMR-W

380

PPP-FM

10

Silicon cantilever for force modulation mode,

20

50

PPP-FM-W

380

PPP-FMR

10

Silicon cantilever for force modulation mode, detector side:Al-coating

20

50

PPP-FMR-W

380

PPP-FMAu

10

Silicon cantilever for force modulation mode,

detector and tip side: Au-coating

PPP-FMAuD

10

Silicon cantilever for force modulation mode,

detector  side: Au-coating

PPP-QFMR

10

Silicon cantilever for force modulation mode,

High quality factor for UHV applications, detector side: Al-coating

PPP-RT-FMR

10

Silicon cantilever for force modulation mode,

Tip rotated by 180°,detector side: Al-coating

20

50

PL2-FM

10

Silicon-SPM-Probe with plateau tip, Silicon cantilever for force modulation mode,

PL2-FMR

10

Silicon-SPM-Probe with plateau tip, Silicon cantilever for force modulation mode, detector side:Al-coating

TL-FM

10

Tipless silicon cantilever based on POINTPROBE technology

20

50

SSS-FM

10

Silicon cantilever for force modulation mode,

With SUPERSHARPSILICON tip

20

50

SSS-FMR

10

Silicon cantilever for force modulation mode,

With SUPERSHARPSILICON tip,

detector side:Al-coating

20

50

DT-FMR

10

金刚石探针，Silicon cantilever for force modulation mode, 镀层：Al

20

50

CDT-FMR

10

导电金刚石探针，Silicon cantilever for force modulation mode, 镀层：Al

20

50

PPP-EFM

10

Silicon cantilever for electrostatic force Microscopy, detector side:Pt/Ir-coating , tip side: Pt/Ir-coating

20

50

PPP-EFM-W

370

PPP-MFMR

10

Silicon cantilever for Magnetic force Microscopy, detector side:Al-coating , tip side: hard magnetic coating

20

50

PPP-MFMR-W

370

PPP-LM-MFMR

10

Silicon cantilever for Magnetic force Microscopy, Low Moment ,detector side:Al-coating , tip side: hard magnetic coating

20

50

PPP-LC-MFMR

10

Silicon cantilever for Magnetic force Microscopy, Low Coercivity ,detector side:Al-coating , tip side: hard magnetic coating

20

50

PPP-QLC-MFMR

10

Silicon cantilever for Magnetic force Microscopy, Low Coercivity ,high quality factor for UHV applications,detector side:Al-coating , tip side: hard magnetic coating

SSS-MFMR

10

Silicon cantilever for high resolution Magnetic force Microscopy, detector side:Al-coating , tip side: hard magnetic coating

20

50

SSS-QMFMR

10

Silicon cantilever for Magnetic force Microscopy, ,high quality factor for UHV applications,detector side:Al-coating , tip side: hard magnetic coating

2D200

1

CALIBRATION STANDARD for x-y calibration of the scanning mechanism,lattice of inverted pyramids,200nm pitch

2D300

1

CALIBRATION STANDARD for x-y calibration of the scanning mechanism,lattice of inverted pyramids,300nm pitch

H8

1

HEIGHT STANDARD for very precise z-calibration,nominal step height: 8nm

FLAT

1

FLATNESS STANDARD for analysis and correction of the scanner bow,smooth plane with a maximum peak to valley distance of 10nm on a 100x100u㎡ area